@inproceedings{RaiolKARWBS2018,
  author = { Raiola, Pascal and Kochte, Michael A. and Atteya, Ahmed and Rodríguez Gómez, Laura and Wunderlich, Hans-Joachim and Becker, Bernd and Sauer, Matthias},
  title = {{Detecting and Resolving Security Violations in Reconfigurable Scan Networks}},
  booktitle = {Proceedings of the 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'18)},
  year = {2018},
  pages = {91--96},
  keywords = {Reconfigurable Scan Network, Hardware Security, Data Flow, IEEE Std 1687},
  abstract = {Reconfigurable Scan Networks (RSNs) allow flexible access to embedded instruments for post-silicon validation and debug or diagnosis. However, this scan infrastructure can also be exploited to leak or corrupt critical information as observation and controllability of registers deep inside the circuit are increased. Securing an RSN is mandatory for maintaining safe and secure circuit operations but difficult due to its complex data flow dependencies. This work proposes a method that detects security violations and transforms a given insecure RSN into a secure RSN for which the secure data flow as specified by a user is guaranteed by construction. The presented method is guided by user-defined cost functions that target e.g. test performance or wiring cost. We provide a case study and experimental results demonstrating the applicability of the method to large designs with low runtime.},
  doi = {http://dx.doi.org/10.1109/IOLTS.2018.8474188},
  file = {http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2018/IOLTS_RaiolKARWBS2018.pdf}
}

@inproceedings{KochtSRRBW2017,
  author = {Kochte, Michael A. and Sauer, Matthias and Rodríguez Gómez, Laura and Raiola, Pascal and Becker, Bernd and Wunderlich, Hans-Joachim},
  title = {{Specification and Verification of Security in Reconfigurable Scan Networks}},
  booktitle = {Proceedings of the 22nd IEEE European Test Symposium (ETS'17)},
  year = {2017},
  pages = {1--6},
  keywords = {Keywords-Access Control, On-Chip Infrastructure, Reconfigurable Scan Network, Verification, Side-Channel Attack, IEEE Std 1687, IJTAG, Hardware Security},
  abstract = {A large amount of on-chip infrastructure, such as design-for-test, debug, monitoring, or calibration, is required for the efficient manufacturing, debug, and operation of complex hardware systems. The access to such infrastructure poses severe system safety and security threats since it may constitute a side-channel exposing internal state, sensitive data, or IP to attackers. Reconfigurable scan networks (RSNs) have been proposed as a scalable and flexible scan-based access mechanism to on-chip infrastructure. The increasing number and variety of integrated infrastructure as well as diverse access constraints over the system lifetime demand for systematic methods for the specification and formal verification of access protection and security properties in RSNs. This work presents a novel method to specify and verify fine-grained access permissions and restrictions to instruments attached to an RSN. The permissions and restrictions are transformed into predicates that are added to a formal model of a given RSN to prove which access properties hold or do not hold.},
  doi = {http://dx.doi.org/10.1109/ETS.2017.7968247},
  file = {http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2017/ETS_KochtSRRBW2017.pdf}
}

@inproceedings{RodriW2016,
  author = {Rodríguez Gómez, Laura and Wunderlich, Hans-Joachim},
  title = {{A Neural-Network-Based Fault Classifier}},
  booktitle = {Proceedings of the 25th IEEE Asian Test Symposium (ATS'16)},
  year = {2016},
  pages = {144--149},
  keywords = {Neural networks, machine learning, fault classification, diagnosis},
  abstract = {In order to reduce the number of defective parts and increase yield, especially in early stages of production, systematic defects must be identified and corrected as soon as possible. This paper presents a technique to move defect classification to the earliest phase of volume testing without any special diagnostic test patterns. A neural-network-based fault classifier is described, which is able to raise a warning, if the frequency of certain defect mechanisms increases. Only in this case more sophisticated diagnostic patterns or the even more expensive physical failure analysis have to be applied. The fault classification method presented here is able to extract underlying fault types with high confidence by identifying relevant features from the circuit topology and from logic simulation.},
  doi = {http://dx.doi.org/10.1109/ATS.2016.46},
  file = {http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2016/ATS_RodriW2016.pdf}
}

@article{RodriCIHW2014,
  author = {Rodríguez Gómez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim},
  title = {{Adaptive Bayesian Diagnosis of Intermittent Faults}},
  journal = {Journal of Electronic Testing: Theory and Applications (JETTA)},
  year = {2014},
  volume = {30},
  number = {5},
  pages = {527--540},
  keywords = { Built-In Self-Test, Built-in diagnosis, Transient faults, Intermittent faults, Bayesian diagnosis },
  abstract = { With increasing transient error rates, distinguishing intermittent and transient faults is especially challenging. In addition to particle strikes relatively high transient error rates are observed in architectures for opportunistic computing and in technologies under high variations. This paper presents a method to classify faults into permanent, intermittent and transient faults based on some intermediate signatures during embedded test or built-in self-test.
 Permanent faults are easily determined by repeating test sessions. Intermittent and transient faults can be identified by the amount of failing test sessions in many cases. For the remaining faults, a Bayesian classification technique has been developed which is applicable to large digital circuits. The combination of these methods is able to identify intermittent faults with a probability of more than 98 %.},
  url = { http://link.springer.com/article/10.1007/s10836-014-5477-1 },
  doi = {http://dx.doi.org/10.1007/s10836-014-5477-1},
  file = {http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2014/JETTA_RodriCIHW2014.pdf}
}

@inproceedings{ReimaGTCRUWAE2014,
  author = {Reimann, Felix and Glaß, Michael and Teich, Jürgen and Cook, Alejandro and Rodríguez Gómez, Laura and Ull, Dominik and Wunderlich, Hans-Joachim and Abelein, Ulrich and Engelke, Piet},
  title = {{Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures}},
  booktitle = {Proceedings of the 51st ACM/IEEE Design Automation Conference (DAC'14)},
  year = {2014},
  pages = {1--9},
  abstract = {The constantly growing amount of semiconductors in automotive systems increases the number of possible defect mechanisms, and therefore raises also the effort to maintain a sufficient level of quality and reliability. A promising solution to this problem is the on-line application of structural tests in key components, typically ECUs. In this work, an approach for the optimized integration of both Software-Based Self-Tests (SBST) and Built-In Self-Tests (BIST) into E/E architectures is presented. The approach integrates the execution of the tests non-intrusively, i. e., it (a) does not affect functional applications and (b) does not require costly changes in the communication schedules or additional communication overhead. Via design space exploration, optimized implementations with respect to multiple conflicting objectives, i. e., monetary costs, safety, test quality, and required execution time are derived.},
  doi = {http://dx.doi.org/10.1145/2593069.2602971},
  file = {http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2014/DAC_ReimaGTCRUWAE2014.pdf}
}

@inproceedings{AbeleCEGRRRTUW2014,
  author = {Abelein, Ulrich and Cook, Alejandro and Engelke, Piet and Glaß, Michael and Reimann, Felix and Rodríguez Gómez, Laura and Russ, Thomas and Teich, Jürgen and Ull, Dominik and Wunderlich, Hans-Joachim},
  title = {{Non-Intrusive Integration of Advanced Diagnosis Features in Automotive E/E-Architectures}},
  booktitle = {Proceedings of the Design, Automation and Test in Europe (DATE'14)},
  year = {2014},
  keywords = {Automotive Structural Diagnosis, BIST},
  abstract = {With ever more complex automotive systems, the current approach of using functional tests to locate faulty components results in very long analysis procedures and poor diagnostic accuracy. Built-In Self-Test (BIST) offers a promising alternative to collect structural diagnostic information during E/E-architecture test. However, as the automotive industry is quite cost-driven, structural diagnosis shall not deteriorate traditional design objectives. With this goal in mind, the work at hand proposes a design space exploration to integrate structural diagnostic capabilities into an E/E-architecture design. The proposed integration is performed non-intrusively, i. e., the addition and execution of tests (a) does not affect any functional applications and (b) does not require any costly changes in the communication schedules.},
  url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6800574},
  doi = {http://dx.doi.org/10.7873/DATE.2014.373},
  file = {http://www.iti.uni-stuttgart.de/fileadmin/rami/files/publications/2014/DATE_AbeleCEGRRRTUW2014.pdf}
}

@inproceedings{RodriKAW2017,
  author = {Rodríguez Gómez, Laura and Kochte, Michael A. and Atteya, Ahmed and Wunderlich, Hans-Joachim},
  title = {{Quantifying Security in Reconfigurable Scan Networks}},
  booktitle = {2nd International Test Standards Application Workshop (TESTA), co-located with IEEE European Test Symposium},
  year = {2017}
}

@inproceedings{CookRHIW2013,
  author = {Cook, Alejandro and Rodriguez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim},
  title = {{Adaptive Test and Diagnosis of Intermittent Faults}},
  booktitle = {14th Latin American Test Workshop (LATW'13)},
  year = {2013}
}