Directly to:

Zur Webseite der Uni Stuttgart

Graduate School

                                                                 

Intelligent Methods for Semiconductor Test and Reliability

Today's economy and entire society rest upon the dependability of information technology and especially of the underlying hardware infrastructure. Thoroughly tested systems are mandatory for a responsible use of technology. Without test and diagnosis, there would be no economical way to develop new technology nodes and to bring novel, complex products into the market. Summarizing, test and diagnosis form an enabling technology for the information society.

Semiconductor test is becoming more and more challenging, since recent technology allows the implementation of systems of tremendous complexity in many aspects. New challenges are only mastered by combining many fields from computer science and electrical engineering including machine learning or artificial intelligence in a structured way. To face these challenges, the University of Stuttgart will establish a Graduate School "Intelligent Methods for Semiconductor Test and Reliability" which will be funded by the company Advantest, Tokyo, and which will closely cooperate with the branch in Böblingen. Around 10 PhD candidates and one Juniorprofessor will work together towards new solutions.

 

The Kick-off Colloquium of the Graduate School took place on

 

February 7th, 2019, 13:00 o‘clock

Computer Science Building of the University of Stuttgart

Room 38.04, Universitätsstraße 38,

70569 Stuttgart

 

Program (download flyer):

13:00

Opening
Miriam Mehl, Deputy Dean of the Faculty of Computer Science,
Electrical Engineering and Information Technology

13:10

Welcome Addresses
Wolfram Ressel, Rector of the University of Stuttgart
Hans-Juergen Wagner, CEO Advantest Europe GmbH

13:40

The Graduate School “Intelligent Methods for Semiconductor Test and Reliability”
Hans-Joachim Wunderlich, Professor, University of Stuttgart

14:10

Research Problems for the Graduate School
Jochen Rivoir, Fellow, Advantest Europe GmbH

14:40

Intelligent Methods for Semiconductor Test and Reliability
Krishnendu Chakrabarty, Duke University, NC

15:30

Reception

 

 

Akzeptieren

Diese Webseite verwendet Cookies. Durch die Nutzung dieser Webseite erklären Sie sich damit einverstanden, dass Cookies gesetzt werden. Mehr erfahren, zum Datenschutz